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test equipment - Embedded Systems
Current list of bloggers:
Alex Bandar | DM | Dr Cagri Tanriover | Dr. Tayyar GUZEL | fabien le mentec | Gene Breniman | Jason Sachs | Jayaraman Kiruthi Vasan | Jim Pruett | Kim Mansfield | Kunal Singh | Martin Strubel | Maykel Alonso | Maziar Tasbihi | Morten Dramstad | Pragnesh Patel | Richard Dorfner | Stephane Boucher | Stephen Friederichs | Wouter van Ooijen
Alex Bandar | DM | Dr Cagri Tanriover | Dr. Tayyar GUZEL | fabien le mentec | Gene Breniman | Jason Sachs | Jayaraman Kiruthi Vasan | Jim Pruett | Kim Mansfield | Kunal Singh | Martin Strubel | Maykel Alonso | Maziar Tasbihi | Morten Dramstad | Pragnesh Patel | Richard Dorfner | Stephane Boucher | Stephen Friederichs | Wouter van Ooijen
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Oscilloscope review: Hameg HMO2024
Last year I wrote about some of the key characteristics of oscilloscopes that are important to me for working with embedded microcontrollers. In that blog entry I rated the Agilent MSOX3024A...
posted by Jason Sachs on Mar 28 2013 under test equipment Comments (1) |
A Useful Current Profiling Method
In one of my recent projects, I had to capture the dynamic current profile of a short-range wireless embedded platform for a number of operation scenarios. Due to the dynamic nature of the cur... 
posted by Dr Cagri Tanriover on Jul 2 2012 under circuit design | test equipment | measurement Comments (3) |
Oscilloscope Dreams
My coworkers and I recently needed a new oscilloscope. I thought I would share some of the features I look for when purchasing one. When I was in college in the early 1990's, our oscilloscopes look...
posted by Jason Sachs on Jan 14 2012 under test equipment Comments (4) |