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measurement - Embedded Systems
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Alex Bandar | DM | Dr Cagri Tanriover | Dr. Tayyar GUZEL | fabien le mentec | Gene Breniman | Jason Sachs | Jayaraman Kiruthi Vasan | Jim Pruett | Kim Mansfield | Kunal Singh | Martin Strubel | Maykel Alonso | Maziar Tasbihi | Morten Dramstad | Pragnesh Patel | Richard Dorfner | Stephane Boucher | Stephen Friederichs | Wouter van Ooijen
Alex Bandar | DM | Dr Cagri Tanriover | Dr. Tayyar GUZEL | fabien le mentec | Gene Breniman | Jason Sachs | Jayaraman Kiruthi Vasan | Jim Pruett | Kim Mansfield | Kunal Singh | Martin Strubel | Maykel Alonso | Maziar Tasbihi | Morten Dramstad | Pragnesh Patel | Richard Dorfner | Stephane Boucher | Stephen Friederichs | Wouter van Ooijen
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Endianness and Serial Communication
Endianness is a consideration that is easily overlooked in the design of embedded systems. I myself am amply guilty of this oversight. It’s something you don’t ever have to worry about if ...
posted by Stephen Friederichs on May 20 2013 under Tutorials | communications | measurement Comments (0) |
How to Estimate Encoder Velocity Without Making Stupid Mistakes: Part I
Here's a common problem: you have a quadrature encoder to measure the angular position of a motor, and you want to know both the position and the velocity. How do you do it? Some people do it poorly -... 
posted by Jason Sachs on Dec 27 2012 under Tutorials | sensors | measurement | signal processing Comments (17) |
A Working Real Time Clock (RTC) Implementation
In one of my projects, data captured from various sensors had to be time stamped in the YearYear/DayDay/MonthMonth, HoursHours:MinutesMinutes:SecondsSeconds format. My initial thought was because ther... 
posted by Dr Cagri Tanriover on Mar 25 2013 under real-time clock | product design | measurement Comments (2) |
A Useful Current Profiling Method
In one of my recent projects, I had to capture the dynamic current profile of a short-range wireless embedded platform for a number of operation scenarios. Due to the dynamic nature of the cur...
posted by Dr Cagri Tanriover on Jul 2 2012 under circuit design | test equipment | measurement Comments (3) |