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Oliver, We've done some work on this, but none of it is specific to HC11. You'll find a copy of one of our papers: Ong, H.L.R, Pont, M.J. and Peasgood, W. (2001) "Do software-based techniques increase the reliability of embedded applications in the presence of EMI?" Microprocessors and Microsystems, 24 (10): 481-491. ...on my home page: http://www.le.ac.uk/engineering/mjp9/ The paper on the WWW site - which is a pre-print (for copyright reasons) and has a dreadful format - has various references to other sources which may be of interest. Best wishes, Michael. > From: "Oliver Betz" > > > not necessarily the best or only solution. In this case, one impact of EMI > > can be corruption of the program counter, which has an impact (in some > > circumstances) like a 'random' GOTO statement. Filling blank areas > > Have you any references for this information or is it own experience? > I observed PC corruption the first time when testing a 912D60A design > against indirect ESD but never before with HC11 and PIC16C... > designs.

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