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AD3552RBCPZ16

ADIAD3552RBCPZ16

Analog Devices Inc.
16 Bit Digital to Analog Converter 2 32-LFCSP (5x5)
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Overview

The AD3552RBCPZ16 is a high-speed, 16-bit, dual-channel voltage output DAC designed for precision signal generation. It features a current-steering architecture and an integrated 2.5V reference with a low 10 ppm/C temperature coefficient, achieving a fast 100ns settling time. This DAC is ideal for high-performance systems requiring low latency and accurate DC performance in a compact 5x5mm LFCSP package.

Why Choose This Part

The device offers excellent DC accuracy with an INL of +/-2 LSB and integrated error detectors for enhanced system reliability. Its wide operating temperature range of -40C to 105C and low power consumption of 22mA during operation make it suitable for thermally constrained industrial environments.

Applications

Hardware-in-the-Loop (HIL)
Utilizes the fast 100ns settling time for real-time simulation of sensor signals and actuator feedback.
Automated Test Equipment
Provides high-resolution programmable voltage sources for semiconductor and PCB level functional testing.
Medical Instrumentation
Enables precision control for diagnostic imaging and patient monitoring equipment requiring stable voltage outputs.
Optical Communications
Controls laser bias currents and optical modulator levels with high speed and precision.

Key Specifications

Output Type Voltage - Buffered
Architecture Current Steering
INL/DNL (LSB) +/-2, +/-1
Mounting Type Surface Mount
Settling Time 100ns
Data Interface SPI
Number of Bits 16
Package / Case 32-VFQFN Exposed Pad, CSP
Reference Type External, Internal
Differential Output No
Operating Temperature -40degC ~ 105degC
Supplier Device Package 32-LFCSP (5x5)
Number of D/A Converters 2
Voltage - Supply, Analog 4.75V ~ 5.25V
Voltage - Supply, Digital 1.71V ~ 1.89V

Getting Started

To evaluate this DAC, use the AD3552R-FMC-EBZ evaluation board which interfaces with standard FPGA development platforms. Implementation requires a SPI-compatible controller to manage the data interface and configuration of the multiple error detectors.