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FRDMGD3100HBIEVM

FRDMGD3100HBIEVM

NXP USA Inc.
KL1x, KL2x, MC33GD3100 - Gate Driver Power Management Evaluation Board
Active23 in stock

Overview

The FRDMGD3100HBIEVM is a half-bridge evaluation board designed specifically for high-voltage power management and gate driver characterization. It features the MC33GD3100 advanced gate driver and is optimized for direct connection to Infineon Hybrid PACK Drive IGBT modules. The board includes an integrated KL1x/KL2x MCU for local control and SPI communication.

Why Choose This Part

The board offers software-configurable power and fail-safe controls through the SPIGen GUI, simplifying the tuning of gate drive parameters. It provides easy access to power, ground, and signal test points, alongside built-in DC link bus voltage monitoring for comprehensive system observation.

Applications

Traction Inverter Evaluation
Validating gate driver performance and protection schemes in electric vehicle traction inverter stages.
IGBT Module Characterization
Performing double-pulse and short-circuit testing on Infineon Hybrid PACK Drive IGBTs.
High-Voltage Motor Control
Developing functional safety and fail-safe controls for industrial or automotive motor drives.
SPI Daisy-Chain Testing
Evaluating multi-driver communication architectures using the software-configurable SPI interface.

Key Specifications

Type Power Management
Contents Board(s)
Embedded Yes, MCU, 32-Bit
Function Gate Driver
Primary Attributes 1-Channel (Single)
Utilized IC / Part KL1x, KL2x, MC33GD3100
Secondary Attributes SPI Interface(s)

Getting Started

To begin, connect the board to a PC via USB and use the SPIGen software for SPI configuration and automated testing such as double pulse tests. Ensure the DC link and signal test points are properly monitored before applying high voltage to the IGBT module interface. Software templates are available for the onboard KL series MCU to facilitate rapid firmware development.