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Disturbing errata for the LPC1765 RTC

Started by afolly_mil2 July 26, 2010
Hi to all and many thanks for the heads-up. I was indeed considering the
LPC1768 for a project that could be running at extreme temperatures
(possibly above +50C from time to time and definitely below -20C in the
winter at some locations).

I've snipped all the discussion - Is anyone chasing the actual issue with
NXP and will send the reply to the list or is it better to contact tech
support individually? I guess that, if we all send reports, they will have
more pressure to document more thoroughly the issue and publish some plans
:-)

Thanks in advance
Cheers
Olivier
On Mon, Jul 26, 2010 at 6:10 PM, Mike Harrison wrote:

> On Tue, 27 Jul 2010 01:22:54 +0530, you wrote:
>
> >1751, 1752, 1754, 1756, 1758, 1759, 1763, 1764, 1765, 1766, 1768, 1769 all
> >have the problem mentioned in their Errata Sheets.
> >
> >1767 does not have an errata doc updated in July 2010 like the others.
> > Either they will update it soon, or it is free of the problem. [...]
>
Olivier Gautherot
o...@gautherot.net
Cel:+56 98 730 9361
www.gautherot.net
http://www.linkedin.com/in/ogautherot

An Engineer's Guide to the LPC2100 Series

--- In l..., Olivier Gautherot wrote:
>
> I've snipped all the discussion - Is anyone chasing the actual issue with
> NXP and will send the reply to the list or is it better to contact tech
> support individually? I guess that, if we all send reports, they will have
> more pressure to document more thoroughly the issue and publish some plans
> :-)

I noticed that the issue has also been raised on the NXP MCU discussion forum:

http://forums.nxp.com/viewforum.php?f=1

However, Europe is on summer holiday right now isn't it ;-)

Regards,
Chris

Chris,
NXP headquarters are in the Netherlands but the microcontrollers are designed and supported from San Jose, CA. In all likelihood this issue is very hot right now in the design team. Analog problems are sometimes extremely difficult to quantify and we could be talking about some nanoamps here and there that determine whether the RTC is reliable or not.
Testing is easy for features that are digital and fast but not so easy for analog, slow, leakage dependent, temperature dependent, may be voltage dependent...??
I am sure NXP tested at nominal and limit values but not all possible combination thereof. And there is that unknown element of process variation. Even if several manufacturing lots were tested, there is still a potential for failure.
Please don't get me wrong, this is not an excuse for missing this errata.
There will be a fix, no doubt the question is whether the redesign or your mass production will be sooner.
Before abandoning ship and looking at other options, stay calm and give NXP a couple days to react.
btw. I am not from NXP or paid by or sponsored by.... NXP.

Hope that this will come to a resolution soon.

Bob

--- In l..., "cfbsoftware1" wrote:
>
> --- In l..., Olivier Gautherot wrote:
> >
> > I've snipped all the discussion - Is anyone chasing the actual issue with
> > NXP and will send the reply to the list or is it better to contact tech
> > support individually? I guess that, if we all send reports, they will have
> > more pressure to document more thoroughly the issue and publish some plans
> > :-)
>
> I noticed that the issue has also been raised on the NXP MCU discussion forum:
>
> http://forums.nxp.com/viewforum.php?f=1
>
> However, Europe is on summer holiday right now isn't it ;-)
>
> Regards,
> Chris
>

Hi all,

Quote from NXP sources:
"The fix for the RTC is understood and fixed silicon has taped out. We will have the fixed RTC parts (for LPC17xx) released for sale in the latter half of Q4"

Hope that helps.

Regards,
-daniel

--- In l..., "Bob T" wrote:
>
> Chris,
> NXP headquarters are in the Netherlands but the microcontrollers are designed and supported from San Jose, CA. In all likelihood this issue is very hot right now in the design team. Analog problems are sometimes extremely difficult to quantify and we could be talking about some nanoamps here and there that determine whether the RTC is reliable or not.
> Testing is easy for features that are digital and fast but not so easy for analog, slow, leakage dependent, temperature dependent, may be voltage dependent...??
> I am sure NXP tested at nominal and limit values but not all possible combination thereof. And there is that unknown element of process variation. Even if several manufacturing lots were tested, there is still a potential for failure.
> Please don't get me wrong, this is not an excuse for missing this errata.
> There will be a fix, no doubt the question is whether the redesign or your mass production will be sooner.
> Before abandoning ship and looking at other options, stay calm and give NXP a couple days to react.
> btw. I am not from NXP or paid by or sponsored by.... NXP.
>
> Hope that this will come to a resolution soon.
>
> Bob

--- In l..., "daniel.widyanto" wrote:
>
> Quote from NXP sources:
> "The fix for the RTC is understood and fixed silicon has taped out. We will have the fixed RTC parts (for LPC17xx) released for sale in the latter half of Q4"
>
> Hope that helps.
>

Thanks for the info. Did the NXP source detail what the problem actually is e.g. does the problem only exist for part of the specified temperature range?

To me NXP gave this explanation:
The problem is it does not work at extreme temperatures. At room temperature it has an asymmetric duty cycle and is more sensitive to the specific crystal used than it should be, so it also may not work. You can probably get it to work for development but it is not dependable enough to go into production.
We will have the errata fixed LPC1700 - RTC parts released for sale in the latter half of Q4.
--- In l..., "daniel.widyanto" wrote:
>
> Hi all,
>
> Quote from NXP sources:
> "The fix for the RTC is understood and fixed silicon has taped out. We will have the fixed RTC parts (for LPC17xx) released for sale in the latter half of Q4"
>
> Hope that helps.
>
> Regards,
> -daniel
>
> --- In l..., "Bob T" wrote:
> >
> > Chris,
> > NXP headquarters are in the Netherlands but the microcontrollers are designed and supported from San Jose, CA. In all likelihood this issue is very hot right now in the design team. Analog problems are sometimes extremely difficult to quantify and we could be talking about some nanoamps here and there that determine whether the RTC is reliable or not.
> > Testing is easy for features that are digital and fast but not so easy for analog, slow, leakage dependent, temperature dependent, may be voltage dependent...??
> > I am sure NXP tested at nominal and limit values but not all possible combination thereof. And there is that unknown element of process variation. Even if several manufacturing lots were tested, there is still a potential for failure.
> > Please don't get me wrong, this is not an excuse for missing this errata.
> > There will be a fix, no doubt the question is whether the redesign or your mass production will be sooner.
> > Before abandoning ship and looking at other options, stay calm and give NXP a couple days to react.
> > btw. I am not from NXP or paid by or sponsored by.... NXP.
> >
> > Hope that this will come to a resolution soon.
> >
> > Bob
>